Image-Based Fractal Description of Microstructures

Li, J. M. (EDT)/ Lu, Li (EDT)/ Lai, M. O. (EDT)/ Ralph, B. (EDT)

Kluwer Academic Pub（2003/06発売）

• 製本 Hardcover:ハードカバー版／ページ数 272 p.
• 言語 ENG
• 商品コード 9781402075070
• DDC分類 620.11299

Full Description

Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.

Contents

1 Introduction.- 2 Digital Images of Microstructures.- 3 Image Processing.- 4 Fundamental Statistics.- 5 Fractal Fundamentals.- 6 Fractal Measurements of Projection Microstructures.- 7 Fractal Measurements of Topographical Images from 3D Surfaces.- 8 Irregularity of Graphite Nodules.- 9 Fractal Growth of Graphite Nodules.- 10 Fractal—based Study of Magnetic Thin Films.- 11 Fractal-based Study of Fracture Surfaces.- References.