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基本説明
Describes diffraction, imaging and spectroscopy of carbon-based nanotubes, the physical property nanomeasurements of carbon nanotubes based on in-situ TEM, and more.
Full Description
Written by prominent scientists, this book is the first to specifically address the theory, techniques, and application of electron microscopy and associated techniques for nanotube research, a topic that is impacting a variety of fields, such as nanoelectronics, flat panel display, nanodevices, and novel instrumentation.
Contents
Preface. List of Contibutors. 1. Single walled carbon nanotubes; L.C. Qin. 2. Electron diffraction and microscopy of single-wall carbon nanotube bundles; J.F. Colomer, G.van Tendeloo. 3. Nanodiffraction of carbon nanotubes; J.M. Cowley. 4. The smallest carbon nanotubes; N. Wang. 5. EELS of carbon nanotubes and onions; T. Stöckli. 6. Carbon nanostructures under the electron beam: Formation of new structures and in-situ study of radiation-induced processes; S. Trasobares, P.M. Ajayan. 7. In-situ mechanical properties of nanotubes and nanowires; Z.l. Wang. 8. In-situ field emission of carbon nanotubes; Z.l. Wang. 9. In-situ electric transport of carbon nanotubes; Z.l. Wang. 10. Electron microscopy of boron nitride nanotubes; D. Golberg, Y. Bando. 11. Inorganic nanoparticles with fullerene-like structure and inorganic nanotubes; R. Tenne, R. Popovitz-Biro.