European Test Conference (Etw 2002), 7th IEEE

European Test Conference (Etw 2002), 7th IEEE

  • IEEE(2002/08発売)
  • ただいまウェブストアではご注文を受け付けておりません。 ⇒古書を探す
  • 製本 Paperback:紙装版/ペーパーバック版
  • 言語 ENG
  • 商品コード 9780769517155
  • DDC分類 004

Full Description


Seventeen contributions to the May 2002 conference (devoted to issues of electronic-based circuit and system testing) are presented here. Topics include silicon technology advances and implications on test, a test time reduction algorithm for test architecture design for core-based systems, modeling