Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques : 12th International Conference, STM'03 (Aip Conference Proceedings) / Koenraad, Paul M. (EDT)/ Kemerink, Martijn (EDT)

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Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques : 12th International Conference, STM'03 (Aip Conference Proceedings)

Koenraad, Paul M. (EDT)/ Kemerink, Martijn (EDT)

American Institute of Physics（2003/12発売）

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ページ数 197 p.
言語 ENG
商品コード 9780735401686
DDC分類 502.82

Full Description

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.