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Full Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contents
CISCEM 2014 Niels de Jonge
Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan
Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk