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Full Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contents
Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll
Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jürgen Grotemeyer
A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap
The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard