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Full Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contents
Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin
Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa
Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI
Superresolution Imaging - Revisited - Markus E. Testorf
Methods and Limitations of Subwavelength Imaging Andrew Neice