- ホーム
- > 洋書
- > 英文書
- > Science / Mathematics
基本説明
Contets: Part I: Imaging Mechanism - Atom-scale tunneling, Tunneling matrix elements, Wavefunctions at surfaces, etc. Part II: Instrumentation - Piezoelectric scanner, Vibration Isolation, Electronics and control, Coarse positioner and STM design, etc.
Full Description
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available
only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully
detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Contents
1: Overview. Part I: Imaging Mechanism. 2: Atom-scale tunneling. 3: Tunneling matrix elements. 4: Wavefunctions at surfaces. 5: Imaging crystalline surfacces. 6: Imaging atomic states. 7: Atomic forces and tunneling. 8: Tip-sample interactions. Part II: Instrumentation. 9: Piezoelectric scanner. 10: Vibration isolation. 11: Electronics and control. 12: Coarse positioner and STM design. 13: Tip treatment. 14: Scanning tunneling spectroscopy. 15: Atomic force microscopy. 16: Illustrative examples. Appendices. References. Index
